At this conference we will present a novel sensor consisting of a cantilever beam with mounted strain gauges. Our patent-pending sensor can simultaneously measure the magnitude of an applied force, the location of the force, and the deformation of the beam caused by the force. The sensor uses a minimum of two strain gauges attached at different longitudinal locations along the beam. Additional strain gauges provide more sensitivity but do not affect the core functionality of the sensor. As a force is pressed on the beam, each strain gauge outputs a voltage proportional to strain, which we read into a data acquisition system. The beam requires initial calibration by hanging known weights at precise locations and recording the voltages from the strain gauges. The beam's dimensions and material properties, as well as the location of the strain gauges are required to make these calculations. Once the beam has been calibrated, it can measure a force, location, and displacement at any location along the beam. We will demonstrate the performance of the sensor and discuss challenges and future work.
University / Institution: Brigham Young University
Format: In Person
SESSION B (10:45AM-12:15PM)
Area of Research: Engineering
Faculty Mentor: Douglas Cook