Oral #8: Jeff Perry – A Residual Stress Analysis of Two-Photon Polymerized Thin Film

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Faculty mentor: Roseanne Warren

Thin films have a variety of significant uses in many industries, some of which include semiconductors, optical coatings, light emitting diodes, medical devices, and others. Residual stress exists in many thin-film coatings and can lead to peeling, blistering, cracking, or buckling of the film post-deposition. The objective of this research is to perform the first measurements of residual stress in two-photon polymerized films and correlate these stresses with the polymerization conditions.

Watch my research presentation below.
Questions or comments? Contact me at: u0871655@umail.utah.edu

View my Presentation Slides HERE

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